Conference paper
2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 2024, pp. 1-6
PhD Research Associate - Psyber Security Lab UTEP
Department of Computer Science
University of Texas at El Paso
The University of Texas at El Paso 1801 Hawthorne St El Paso, TX 79902
APA
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Kumar, P., Senthil Pandi, S., Dineshkumar, M., & Sheriff, M. A. (2024). Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras. In 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET) (pp. 1–6). https://doi.org/10.1109/ICRASET63057.2024.10895184
Chicago/Turabian
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Kumar, P, S Senthil Pandi, Mithun Dineshkumar, and Muqaddam Aaqil Sheriff. “Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras.” In 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 1–6, 2024.
MLA
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Kumar, P., et al. “Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras.” 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 2024, pp. 1–6, doi:10.1109/ICRASET63057.2024.10895184.
BibTeX Click to copy
@inproceedings{kumar2024a,
title = {Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras},
year = {2024},
pages = {1-6},
doi = {10.1109/ICRASET63057.2024.10895184},
author = {Kumar, P and Senthil Pandi, S and Dineshkumar, Mithun and Sheriff, Muqaddam Aaqil},
booktitle = {2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET)}
}